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3535
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Prices subject to change without notice
Datasheet: Click here for data sheet in PDF Format
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Hioki 3535-High-speed LCR meter with up to 120MHz sampling
High Speed Testing of Chip Inductors and Magnetic Heads in Research and Development
- Broad Frequency Measurement Range ( 100 kHz to 120 MHz )
- High speed LCR testing (6ms/sample)
- 14 Parameter Types ( |Z|, |Y|, , Rp, Rs(ESR), G, X, B, Lp, Ls, Cp, Cs, D (tan ) and Q )
- Detachable Head Amp
- Load Compensation Function
- BIN ( Classification ) Measurement
| Basic specifications |
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| Measurement Items |
|Z|, |Y|, Q, Rp, Rs(ESR), G, X, B, Θ, Ls, Lp, Cs, Cp, D(tan δ) |
| Measurement ranges |
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1kΩ range |
10kΩ range |
100kΩ range |
| Z, R |
100mΩ to 2kΩ |
1kΩ to 20kΩ |
10kΩ to300kΩ |
| C |
0.66pF to 15.9µF |
0.066pF to 1.59nF |
4.4fF to 159pF |
| L |
0.133nH to 3.18mH |
1.33µH to 31.8mH |
13.3µH to 477mH |
| Θ |
-180.00° to 180.00° |
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| Measurement Frequency |
100 kHz to 120 MHz ( 100Hz to 100kHz steps ) |
| Basic accuracy |
|Z|: ±0.5 % rdg. , phase angle: ±0.3° |
| Output Impedance |
50 ±10 ohm (at 100 kHz) |
| Measurement Signal Level |
5 mV to 1 V, 20 mA max. ( up to 10.00 MHz )
5 mV to 500 mV, 10 mA max. ( above 10.01 MHz )
Setting Resolution: 1mV steps
200 µA to 20 mA: 1 V max. ( up to 10.00 MHz )
200 µA to 10 mA: 0.5 V max. (above 10.01 MHz)
Setting Resolution: 10 µA steps |
| Measurement Time |
6 ± 1 ms (nominal) |
| Other function |
Monitor Function, Limit Function, Average Trigger Function, Load Compensation Function, Key Lock Function, Comparator, Classification ( BIN ) Measurement, Correlation, Compensation Function, Panel Save and Load, Measurement Value Storage, Zoom Display Function, Continuous Measurements, Audible Beeper, Numerical Display, Digit Setting Function, Display Setting Functions, Printer Function |
| Interfaces |
GP-IB, RS-232C and EXT I/O ( standard ) |
| Power |
100 to 240 VAC, 50/60 Hz, 50 VA |
| Dimensions and Mass |
Approx. 360W×130H×360D mm, 8.3 kg |
| Supplied accessories |
Power cord |
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